Improving The Testability Of Mixed-Signal Integrated Circuits

This paper presents a discussion on several methods that can be used to improve the testability of mixed-signal integrated circuits. We begin by outlining the role of test, and its impact on product cost and quality. A brief look at the pending test crises for mixedsignal circuits is also considered. Subsequently, we shall outline several common test strategies, and their corresponding test setups for verifying the function of the analog portion of a mixed-signal circuit. The remainder of the paper will describe several analog test buses and circuits for built-in self-test applications.